In-operando fatigue behavior of gold metallization lines on polyimide substrate
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Authors
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- Erich Schmid Institute of Materials Science
Abstract
Although in-situ monitoring of electrical resistance of polymer-supported thin films during a mechanical test is frequently used, the impact of the magnitude of electric current on material behavior in such experiments remained unknown. Here, we report on cyclic straining of polymer-supported gold metallization lines under direct current of different magnitudes. Fatigue damage in form of localized extrusions becomes more pronounced with increasing current as a result of Joule heat and material softening. After a critical current value is reached, crack propagation results in a local decrease of line cross-section leading to thermal runaway and open circuit failure.
Details
Original language | English |
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Pages (from-to) | 48-51 |
Number of pages | 4 |
Journal | Scripta materialia |
Volume | 186.2020 |
Issue number | September |
DOIs | |
Publication status | Published - 2020 |