In-operando fatigue behavior of gold metallization lines on polyimide substrate

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Authors

Organisational units

External Organisational units

  • Erich Schmid Institute of Materials Science

Abstract

Although in-situ monitoring of electrical resistance of polymer-supported thin films during a mechanical test is frequently used, the impact of the magnitude of electric current on material behavior in such experiments remained unknown. Here, we report on cyclic straining of polymer-supported gold metallization lines under direct current of different magnitudes. Fatigue damage in form of localized extrusions becomes more pronounced with increasing current as a result of Joule heat and material softening. After a critical current value is reached, crack propagation results in a local decrease of line cross-section leading to thermal runaway and open circuit failure.

Details

Original languageEnglish
Pages (from-to)48-51
Number of pages4
JournalScripta materialia
Volume186.2020
Issue numberSeptember
DOIs
Publication statusPublished - 2020