In Situ X-Ray Synchrotron Profile Analysis During High Pressure Torsion of Ti
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Magnesium Technology 2017. Springer Nature, 2017. p. 645-651 ( The Minerals, Metals & Materials Series).
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
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TY - CHAP
T1 - In Situ X-Ray Synchrotron Profile Analysis During High Pressure Torsion of Ti
AU - Schafler, Erhard
AU - Kerber, Michael B.
AU - Spieckermann, Florian
AU - Fischer, Torben
AU - Schuster, Roman
AU - Baeckmann, Cornelia von
PY - 2017
Y1 - 2017
U2 - 10.1007/978-3-319-52392-7_89
DO - 10.1007/978-3-319-52392-7_89
M3 - Chapter
SN - 978-3-319-52391-0
T3 - The Minerals, Metals & Materials Series
SP - 645
EP - 651
BT - Magnesium Technology 2017
PB - Springer Nature
ER -