Force based Tool Wear Detection using Shannon Entropy and Phase Plane

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Standard

Force based Tool Wear Detection using Shannon Entropy and Phase Plane. / Kollment, Werner; O'Leary, Paul; Ritt, Roland et al.
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers, 2017. 7969765.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Harvard

Kollment, W, O'Leary, P, Ritt, R & Kluensner, T 2017, Force based Tool Wear Detection using Shannon Entropy and Phase Plane. in I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings., 7969765, Institute of Electrical and Electronics Engineers, 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, 22/05/17. https://doi.org/10.1109/I2MTC.2017.7969765

APA

Kollment, W., O'Leary, P., Ritt, R., & Kluensner, T. (2017). Force based Tool Wear Detection using Shannon Entropy and Phase Plane. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings Article 7969765 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/I2MTC.2017.7969765

Vancouver

Kollment W, O'Leary P, Ritt R, Kluensner T. Force based Tool Wear Detection using Shannon Entropy and Phase Plane. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers. 2017. 7969765 Epub 2017. doi: 10.1109/I2MTC.2017.7969765

Author

Kollment, Werner ; O'Leary, Paul ; Ritt, Roland et al. / Force based Tool Wear Detection using Shannon Entropy and Phase Plane. I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers, 2017.

Bibtex - Download

@inproceedings{de4a36c6c0b44314ac8a7dad56d002b7,
title = "Force based Tool Wear Detection using Shannon Entropy and Phase Plane",
author = "Werner Kollment and Paul O'Leary and Roland Ritt and Thomas Kluensner",
year = "2017",
month = jul,
day = "5",
doi = "10.1109/I2MTC.2017.7969765",
language = "English",
booktitle = "I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",
note = "2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 ; Conference date: 22-05-2017 Through 25-05-2017",
url = "http://2017.imtc.ieee-ims.org/",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Force based Tool Wear Detection using Shannon Entropy and Phase Plane

AU - Kollment, Werner

AU - O'Leary, Paul

AU - Ritt, Roland

AU - Kluensner, Thomas

PY - 2017/7/5

Y1 - 2017/7/5

UR - http://www.scopus.com/inward/record.url?scp=85026756768&partnerID=8YFLogxK

U2 - 10.1109/I2MTC.2017.7969765

DO - 10.1109/I2MTC.2017.7969765

M3 - Conference contribution

AN - SCOPUS:85026756768

BT - I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings

PB - Institute of Electrical and Electronics Engineers

T2 - 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017

Y2 - 22 May 2017 through 25 May 2017

ER -

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