FIB damage of Cu and possible consequences for miniaturized mechanical tests

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FIB damage of Cu and possible consequences for miniaturized mechanical tests. / Kiener, Daniel; Motz, Christian; Rester, Martin et al.
In: Materials science and engineering: A, Structural materials: properties, microstructure and processing, Vol. 459, 2007, p. 262-272.

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@article{8a645766967448c4b4c99b7a5e1aad4f,
title = "FIB damage of Cu and possible consequences for miniaturized mechanical tests",
author = "Daniel Kiener and Christian Motz and Martin Rester and Monika Jenko and Gerhard Dehm",
year = "2007",
doi = "10.1016/j.msea.2007.01.046",
language = "English",
volume = "459",
pages = "262--272",
journal = "Materials science and engineering: A, Structural materials: properties, microstructure and processing",
issn = "0921-5093",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - FIB damage of Cu and possible consequences for miniaturized mechanical tests

AU - Kiener, Daniel

AU - Motz, Christian

AU - Rester, Martin

AU - Jenko, Monika

AU - Dehm, Gerhard

PY - 2007

Y1 - 2007

U2 - 10.1016/j.msea.2007.01.046

DO - 10.1016/j.msea.2007.01.046

M3 - Article

VL - 459

SP - 262

EP - 272

JO - Materials science and engineering: A, Structural materials: properties, microstructure and processing

JF - Materials science and engineering: A, Structural materials: properties, microstructure and processing

SN - 0921-5093

ER -