Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling
Research output: Contribution to journal › Article › Research › peer-review
Standard
In: Materials and Design, Vol. 2021, No. 198, 109365, 28.11.2020.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling
AU - Meindlhumer, Michael
AU - Brandt, L.R.
AU - Zalesak, Jakub
AU - Rosenthal, M.
AU - Hruby, Hynek
AU - Kopecek, J.
AU - Salvati, E.
AU - Mitterer, Christian
AU - Daniel, Rostislav
AU - Todt, Juraj
AU - Keckes, Jozef
AU - Korsunsky, Alexander M.
PY - 2020/11/28
Y1 - 2020/11/28
N2 - In order to understand the fracture resistance of nanocrystalline thin films, it is necessary to assess nanoscopic multiaxial stress fields accompanying crack growth during irreversible deformation. Here, a clamped cantilever with dimensions of 200 × 23.7 × 40 μm 3 was machined by focused ion beam milling from a thin film composed of four alternating CrN and Cr layers. The cantilever was loaded to 460 mN in two steps and multiaxial strain distributions were determined by in situ cross-sectional X-ray nanodiffraction. Characterization in as-deposited state revealed the depth variation of fibre texture and residual stress across the layers. The in situ experiment indicated a strong influence of the residual stresses on the cross-sectional stress fields evolution and crack arrest capability at the CrN-Cr interface. In detail, an effective negative stress intensity of −5.9 ± 0.4 MPa m ½ arose as a consequence of the residual stress state. Crack growth in the notched Cr layer occurred at a critical stress intensity of 2.8 ± 0.5 MPa m ½. The results were complemented by two-dimensional numerical simulation to gain further insight into the elastic-plastic deformation evolution. The quantitative experimental and modelling results elucidate the stepwise nature of fracture advancement across the alternating brittle and ductile layers and their interfaces.
AB - In order to understand the fracture resistance of nanocrystalline thin films, it is necessary to assess nanoscopic multiaxial stress fields accompanying crack growth during irreversible deformation. Here, a clamped cantilever with dimensions of 200 × 23.7 × 40 μm 3 was machined by focused ion beam milling from a thin film composed of four alternating CrN and Cr layers. The cantilever was loaded to 460 mN in two steps and multiaxial strain distributions were determined by in situ cross-sectional X-ray nanodiffraction. Characterization in as-deposited state revealed the depth variation of fibre texture and residual stress across the layers. The in situ experiment indicated a strong influence of the residual stresses on the cross-sectional stress fields evolution and crack arrest capability at the CrN-Cr interface. In detail, an effective negative stress intensity of −5.9 ± 0.4 MPa m ½ arose as a consequence of the residual stress state. Crack growth in the notched Cr layer occurred at a critical stress intensity of 2.8 ± 0.5 MPa m ½. The results were complemented by two-dimensional numerical simulation to gain further insight into the elastic-plastic deformation evolution. The quantitative experimental and modelling results elucidate the stepwise nature of fracture advancement across the alternating brittle and ductile layers and their interfaces.
UR - http://www.scopus.com/inward/record.url?scp=85097236081&partnerID=8YFLogxK
U2 - 10.1016/j.matdes.2020.109365
DO - 10.1016/j.matdes.2020.109365
M3 - Article
VL - 2021
JO - Materials and Design
JF - Materials and Design
SN - 0264-1275
IS - 198
M1 - 109365
ER -