Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Research output: Contribution to conference › Poster › Research › peer-review
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Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique. / Beinik, Igor; Kratzer, Markus; Teichert, Christian et al.
2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.
2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Beinik, I, Kratzer, M, Teichert, C, Brauer, G, Anwand, W, Chen, X, Hsu, YF & Djurišić, AB 2010, 'Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique', International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria, 30/05/10 - 3/06/10.
APA
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F., & Djurišić, A. B. (2010). Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.
Vancouver
Beinik I, Kratzer M, Teichert C, Brauer G, Anwand W, Chen X et al.. Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique. 2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.
Author
Bibtex - Download
@conference{656b7e6198a5403b8a6f8dcca393223d,
title = "Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique",
author = "Igor Beinik and Markus Kratzer and Christian Teichert and Gerhard Brauer and Wolfgang Anwand and Xinyi Chen and Hsu, {Y. F.} and Djuri{\v s}i{\'c}, {Aleksandra B.}",
year = "2010",
language = "English",
note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
AU - Beinik, Igor
AU - Kratzer, Markus
AU - Teichert, Christian
AU - Brauer, Gerhard
AU - Anwand, Wolfgang
AU - Chen, Xinyi
AU - Hsu, Y. F.
AU - Djurišić, Aleksandra B.
PY - 2010
Y1 - 2010
M3 - Poster
T2 - International Workshop on In situ characterization of near-surface processes
Y2 - 30 May 2010 through 3 June 2010
ER -
