Direct measurement of vacancy relaxation by dilatometry

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Direct measurement of vacancy relaxation by dilatometry. / Kotzurek, Jaromir A.; Steyskal, Eva-Maria; Oberdorfer, Bernd et al.
In: Applied physics letters, Vol. 109.2016, No. 2, 021906, 14.07.2016.

Research output: Contribution to journal › Article › Research › peer-review

Harvard

Kotzurek, JA, Steyskal, E-M, Oberdorfer, B, Hohenwarter, A, Pippan, R, Sprengel, W & Würschum, R 2016, 'Direct measurement of vacancy relaxation by dilatometry', Applied physics letters, vol. 109.2016, no. 2, 021906. https://doi.org/10.1063/1.4958895

APA

Kotzurek, J. A., Steyskal, E.-M., Oberdorfer, B., Hohenwarter, A., Pippan, R., Sprengel, W., & Würschum, R. (2016). Direct measurement of vacancy relaxation by dilatometry. Applied physics letters, 109.2016(2), Article 021906. https://doi.org/10.1063/1.4958895

Vancouver

Kotzurek JA, Steyskal EM, Oberdorfer B, Hohenwarter A, Pippan R, Sprengel W et al. Direct measurement of vacancy relaxation by dilatometry. Applied physics letters. 2016 Jul 14;109.2016(2):021906. doi: 10.1063/1.4958895

Author

Kotzurek, Jaromir A. ; Steyskal, Eva-Maria ; Oberdorfer, Bernd et al. / Direct measurement of vacancy relaxation by dilatometry. In: Applied physics letters. 2016 ; Vol. 109.2016, No. 2.

Bibtex - Download

@article{74bbd0d3e43046d8b59f8662fc8999c1,
title = "Direct measurement of vacancy relaxation by dilatometry",
abstract = "A model is proposed for directly determining the volume of lattice vacancies by means of dilatometric measurements of the anisotropic irreversible length change which occurs during annealing of lattice vacancies at grain boundaries of shape-anisotropic crystallites. The model is tested using nanocrystalline Ni after the high-pressure torsion deformation which exhibits excess concentration of lattice vacancies and elongated crystallite shape. Different length changes upon annealing parallel and perpendicular to the elongation axis occur from which a vacancy volume can be derived.",
author = "Kotzurek, {Jaromir A.} and Eva-Maria Steyskal and Bernd Oberdorfer and Anton Hohenwarter and Reinhard Pippan and Wolfgang Sprengel and Roland W{\"u}rschum",
year = "2016",
month = jul,
day = "14",
doi = "10.1063/1.4958895",
language = "English",
volume = "109.2016",
journal = "Applied physics letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "2",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Direct measurement of vacancy relaxation by dilatometry

AU - Kotzurek, Jaromir A.

AU - Steyskal, Eva-Maria

AU - Oberdorfer, Bernd

AU - Hohenwarter, Anton

AU - Pippan, Reinhard

AU - Sprengel, Wolfgang

AU - Würschum, Roland

PY - 2016/7/14

Y1 - 2016/7/14

N2 - A model is proposed for directly determining the volume of lattice vacancies by means of dilatometric measurements of the anisotropic irreversible length change which occurs during annealing of lattice vacancies at grain boundaries of shape-anisotropic crystallites. The model is tested using nanocrystalline Ni after the high-pressure torsion deformation which exhibits excess concentration of lattice vacancies and elongated crystallite shape. Different length changes upon annealing parallel and perpendicular to the elongation axis occur from which a vacancy volume can be derived.

AB - A model is proposed for directly determining the volume of lattice vacancies by means of dilatometric measurements of the anisotropic irreversible length change which occurs during annealing of lattice vacancies at grain boundaries of shape-anisotropic crystallites. The model is tested using nanocrystalline Ni after the high-pressure torsion deformation which exhibits excess concentration of lattice vacancies and elongated crystallite shape. Different length changes upon annealing parallel and perpendicular to the elongation axis occur from which a vacancy volume can be derived.

UR - http://www.scopus.com/inward/record.url?scp=84978511544&partnerID=8YFLogxK

U2 - 10.1063/1.4958895

DO - 10.1063/1.4958895

M3 - Article

AN - SCOPUS:84978511544

VL - 109.2016

JO - Applied physics letters

JF - Applied physics letters

SN - 0003-6951

IS - 2

M1 - 021906

ER -

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