Direct determination of the area function for nanoindentation experiments
Research output: Contribution to journal › Article › Research › peer-review
Standard
In: Journal of materials research (JMR), Vol. 36.2021, No. 11, 05.02.2021, p. 2154-2165.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Direct determination of the area function for nanoindentation experiments
AU - Saringer, Christian
AU - Tkadletz, Michael
AU - Kratzer, Markus
AU - Cordill, Megan J.
N1 - Publisher Copyright: © 2021, The Author(s).
PY - 2021/2/5
Y1 - 2021/2/5
N2 - TThe determination of a suitable correction for tip blunting is crucial in order to obtain useful mechanical properties from nanoindentation experiments. While typically the required area function is acquired from the indentation of a reference material, the direct imaging by suitable methods is an interesting alternative. In this paper, we investigate the applicability of confocal laser scanning microscopy (CLSM), atomic force microscopy (AFM), and self-imaging by scanning a sharp silicon tip using the scanning probe microscopy extension of the nanoindentation system and compare the results to the area function obtained by the indentation of fused silica. The important tip characteristics were determined by various methods based on the analysis of the obtained 3D data sets. It was found that the suitability of CLSM and AFM depend on the resolution and the operation mode, respectively. While for these methods only limited consistency of the determined tip characteristics was found, self-imaging resulted in an excellent overall agreement.
AB - TThe determination of a suitable correction for tip blunting is crucial in order to obtain useful mechanical properties from nanoindentation experiments. While typically the required area function is acquired from the indentation of a reference material, the direct imaging by suitable methods is an interesting alternative. In this paper, we investigate the applicability of confocal laser scanning microscopy (CLSM), atomic force microscopy (AFM), and self-imaging by scanning a sharp silicon tip using the scanning probe microscopy extension of the nanoindentation system and compare the results to the area function obtained by the indentation of fused silica. The important tip characteristics were determined by various methods based on the analysis of the obtained 3D data sets. It was found that the suitability of CLSM and AFM depend on the resolution and the operation mode, respectively. While for these methods only limited consistency of the determined tip characteristics was found, self-imaging resulted in an excellent overall agreement.
UR - http://www.scopus.com/inward/record.url?scp=85100954519&partnerID=8YFLogxK
U2 - 10.1557/s43578-021-00113-9
DO - 10.1557/s43578-021-00113-9
M3 - Article
VL - 36.2021
SP - 2154
EP - 2165
JO - Journal of materials research (JMR)
JF - Journal of materials research (JMR)
SN - 0884-2914
IS - 11
ER -