Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

Research output: Contribution to journal › Article › Research › peer-review

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Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film. / Zalesak, J.; Bartosik, M.; Daniel, R. et al.
In: Acta materialia, Vol. 102, 2016, p. 212-219.

Research output: Contribution to journal › Article › Research › peer-review

Harvard

Zalesak, J, Bartosik, M, Daniel, R, Mitterer, C, Krywka, C, Kiener, D, Mayrhofer, PH & Keckes, J 2016, 'Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film', Acta materialia, vol. 102, pp. 212-219. https://doi.org/10.1016/j.actamat.2015.09.007

APA

Zalesak, J., Bartosik, M., Daniel, R., Mitterer, C., Krywka, C., Kiener, D., Mayrhofer, P. H., & Keckes, J. (2016). Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film. Acta materialia, 102, 212-219. https://doi.org/10.1016/j.actamat.2015.09.007

Vancouver

Zalesak J, Bartosik M, Daniel R, Mitterer C, Krywka C, Kiener D et al. Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film. Acta materialia. 2016;102:212-219. doi: 10.1016/j.actamat.2015.09.007

Author

Zalesak, J. ; Bartosik, M. ; Daniel, R. et al. / Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film. In: Acta materialia. 2016 ; Vol. 102. pp. 212-219.

Bibtex - Download

@article{e8d24e47b6e74733b5de1e273f1d4371,
title = "Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film",
keywords = "Cantilevers, Gradient, Nano-mechanics, Thin film, X-ray nanodiffraction",
author = "J. Zalesak and M. Bartosik and R. Daniel and C. Mitterer and C. Krywka and D. Kiener and Mayrhofer, {P. H.} and J. Keckes",
note = "cited By 3",
year = "2016",
doi = "10.1016/j.actamat.2015.09.007",
language = "English",
volume = "102",
pages = "212--219",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

AU - Zalesak, J.

AU - Bartosik, M.

AU - Daniel, R.

AU - Mitterer, C.

AU - Krywka, C.

AU - Kiener, D.

AU - Mayrhofer, P. H.

AU - Keckes, J.

N1 - cited By 3

PY - 2016

Y1 - 2016

KW - Cantilevers

KW - Gradient

KW - Nano-mechanics

KW - Thin film

KW - X-ray nanodiffraction

UR - http://www.scopus.com/inward/record.url?scp=84942694249&partnerID=8YFLogxK

U2 - 10.1016/j.actamat.2015.09.007

DO - 10.1016/j.actamat.2015.09.007

M3 - Article

AN - SCOPUS:84942694249

VL - 102

SP - 212

EP - 219

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -

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