Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

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Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110). / Tejedor, Paloma; Díez-Merino, Laura; Beinik, Igor et al.
In: Applied physics letters, Vol. 95, 2009, p. 123103-1-123103-3.

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Tejedor, Paloma ; Díez-Merino, Laura ; Beinik, Igor et al. / Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110). In: Applied physics letters. 2009 ; Vol. 95. pp. 123103-1-123103-3.

Bibtex - Download

@article{bbf2ce5eea344a899447f4674baf6fda,
title = "Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)",
author = "Paloma Tejedor and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",
year = "2009",
doi = "10.1063/1.3232234",
language = "English",
volume = "95",
pages = "123103--1--123103--3",
journal = "Applied physics letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

AU - Tejedor, Paloma

AU - Díez-Merino, Laura

AU - Beinik, Igor

AU - Teichert, Christian

PY - 2009

Y1 - 2009

U2 - 10.1063/1.3232234

DO - 10.1063/1.3232234

M3 - Article

VL - 95

SP - 123103-1-123103-3

JO - Applied physics letters

JF - Applied physics letters

SN - 0003-6951

ER -