Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
Research output: Contribution to journal › Article › Research › peer-review
Standard
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110). / Tejedor, Paloma; Díez-Merino, Laura; Beinik, Igor et al.
In: Applied physics letters, Vol. 95, 2009, p. 123103-1-123103-3.
In: Applied physics letters, Vol. 95, 2009, p. 123103-1-123103-3.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Tejedor, P, Díez-Merino, L, Beinik, I & Teichert, C 2009, 'Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)', Applied physics letters, vol. 95, pp. 123103-1-123103-3. https://doi.org/10.1063/1.3232234
APA
Tejedor, P., Díez-Merino, L., Beinik, I., & Teichert, C. (2009). Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110). Applied physics letters, 95, 123103-1-123103-3. https://doi.org/10.1063/1.3232234
Vancouver
Tejedor P, Díez-Merino L, Beinik I, Teichert C. Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110). Applied physics letters. 2009;95:123103-1-123103-3. doi: 10.1063/1.3232234
Author
Bibtex - Download
@article{bbf2ce5eea344a899447f4674baf6fda,
title = "Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)",
author = "Paloma Tejedor and Laura D{\'i}ez-Merino and Igor Beinik and Christian Teichert",
year = "2009",
doi = "10.1063/1.3232234",
language = "English",
volume = "95",
pages = "123103--1--123103--3",
journal = "Applied physics letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
AU - Tejedor, Paloma
AU - Díez-Merino, Laura
AU - Beinik, Igor
AU - Teichert, Christian
PY - 2009
Y1 - 2009
U2 - 10.1063/1.3232234
DO - 10.1063/1.3232234
M3 - Article
VL - 95
SP - 123103-1-123103-3
JO - Applied physics letters
JF - Applied physics letters
SN - 0003-6951
ER -
