Characterization of single ZnO nanorods by conductive atomic microscopy
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Characterization of single ZnO nanorods by conductive atomic microscopy. / Teichert, Christian.
2009. Poster session presented at International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials, Aeiro, Portugal.
2009. Poster session presented at International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials, Aeiro, Portugal.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Teichert, C 2009, 'Characterization of single ZnO nanorods by conductive atomic microscopy', International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials, Aeiro, Portugal, 23/06/09 - 27/06/09.
APA
Teichert, C. (2009). Characterization of single ZnO nanorods by conductive atomic microscopy. Poster session presented at International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials, Aeiro, Portugal.
Vancouver
Teichert C. Characterization of single ZnO nanorods by conductive atomic microscopy. 2009. Poster session presented at International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials, Aeiro, Portugal.
Author
Bibtex - Download
@conference{0dd8ddc7e239482c9ad2682451358184,
title = "Characterization of single ZnO nanorods by conductive atomic microscopy",
author = "Christian Teichert",
year = "2009",
language = "English",
note = "International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials ; Conference date: 23-06-2009 Through 27-06-2009",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Characterization of single ZnO nanorods by conductive atomic microscopy
AU - Teichert, Christian
PY - 2009
Y1 - 2009
M3 - Poster
T2 - International Symposium Piezoresponse Microscopy and Nanoscale Phenomena in Polar Materials
Y2 - 23 June 2009 through 27 June 2009
ER -
