Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

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Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing. / Mirkowska, Monika; Kratzer, Markus; Teichert, Christian et al.
In: Chemie-Ingenieur-Technik, Vol. 86, 2014, p. 857-864.

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@article{e230aab0c3564e86a5ff94bb20b50360,
title = "Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing",
author = "Monika Mirkowska and Markus Kratzer and Christian Teichert and Helmut Flachberger",
year = "2014",
doi = "10.1002/cite.201400027",
language = "English",
volume = "86",
pages = "857--864",
journal = "Chemie-Ingenieur-Technik",
issn = "0009-286X",
publisher = "Wiley-VCH ",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

AU - Mirkowska, Monika

AU - Kratzer, Markus

AU - Teichert, Christian

AU - Flachberger, Helmut

PY - 2014

Y1 - 2014

U2 - 10.1002/cite.201400027

DO - 10.1002/cite.201400027

M3 - Article

VL - 86

SP - 857

EP - 864

JO - Chemie-Ingenieur-Technik

JF - Chemie-Ingenieur-Technik

SN - 0009-286X

ER -