Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing
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Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing. / Mirkowska, Monika; Kratzer, Markus; Teichert, Christian et al.
In: Chemie-Ingenieur-Technik, Vol. 86, 2014, p. 857-864.
In: Chemie-Ingenieur-Technik, Vol. 86, 2014, p. 857-864.
Research output: Contribution to journal › Article › Research › peer-review
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Mirkowska M, Kratzer M, Teichert C, Flachberger H. Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing. Chemie-Ingenieur-Technik. 2014;86:857-864. doi: 10.1002/cite.201400027
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Bibtex - Download
@article{e230aab0c3564e86a5ff94bb20b50360,
title = "Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing",
author = "Monika Mirkowska and Markus Kratzer and Christian Teichert and Helmut Flachberger",
year = "2014",
doi = "10.1002/cite.201400027",
language = "English",
volume = "86",
pages = "857--864",
journal = "Chemie-Ingenieur-Technik",
issn = "0009-286X",
publisher = "Wiley-VCH ",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing
AU - Mirkowska, Monika
AU - Kratzer, Markus
AU - Teichert, Christian
AU - Flachberger, Helmut
PY - 2014
Y1 - 2014
U2 - 10.1002/cite.201400027
DO - 10.1002/cite.201400027
M3 - Article
VL - 86
SP - 857
EP - 864
JO - Chemie-Ingenieur-Technik
JF - Chemie-Ingenieur-Technik
SN - 0009-286X
ER -
