Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides

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Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides. / Gopon, Phillip; Douglas, James; Meisenkothen, Frederick et al.
In: Microscopy and microanalysis, 2021.

Research output: Contribution to journalArticleResearchpeer-review

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Gopon P, Douglas J, Meisenkothen F, Singh J, London A, Moody M. Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides. Microscopy and microanalysis. 2021. doi: 10.1017/S1431927621013568

Bibtex - Download

@article{0ede68aa751940328f569b774f705d71,
title = "Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides",
author = "Phillip Gopon and James Douglas and Frederick Meisenkothen and Jaspreet Singh and Andrew London and Michael Moody",
year = "2021",
doi = "10.1017/S1431927621013568",
language = "English",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides

AU - Gopon, Phillip

AU - Douglas, James

AU - Meisenkothen, Frederick

AU - Singh, Jaspreet

AU - London, Andrew

AU - Moody, Michael

PY - 2021

Y1 - 2021

U2 - 10.1017/S1431927621013568

DO - 10.1017/S1431927621013568

M3 - Article

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

SN - 1431-9276

ER -