Analytical TEM Study of Microstructure-Property Relations in Liquid-Phase Sintered SiC with AlN- Y2O3 Additives

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Analytical TEM Study of Microstructure-Property Relations in Liquid-Phase Sintered SiC with AlN- Y2O3 Additives. / Huang, R.; Gu, H.; Rixecker, G. et al.
In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques, Vol. 96, 2005, p. 496-502.

Research output: Contribution to journalArticleResearchpeer-review

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@article{7d0e0264dc194581945a67e113ba3d2f,
title = "Analytical TEM Study of Microstructure-Property Relations in Liquid-Phase Sintered SiC with AlN- Y2O3 Additives",
author = "R. Huang and H. Gu and G. Rixecker and F. Aldinger and Christina Scheu and M. R{\"u}hle",
year = "2005",
language = "English",
volume = "96",
pages = "496--502",
journal = "Zeitschrift f{\"u}r Metallkunde : international journal of materials research and advanced techniques",
issn = "0179-4841",
publisher = "Hanser Publishers",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Analytical TEM Study of Microstructure-Property Relations in Liquid-Phase Sintered SiC with AlN- Y2O3 Additives

AU - Huang, R.

AU - Gu, H.

AU - Rixecker, G.

AU - Aldinger, F.

AU - Scheu, Christina

AU - Rühle, M.

PY - 2005

Y1 - 2005

M3 - Article

VL - 96

SP - 496

EP - 502

JO - Zeitschrift für Metallkunde : international journal of materials research and advanced techniques

JF - Zeitschrift für Metallkunde : international journal of materials research and advanced techniques

SN - 0179-4841

ER -