AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy

Research output: Contribution to journalArticleResearchpeer-review

Standard

AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy. / Prohaska, Thomas; FRIEDBACHER, G; GRASSERBAUER, M.
In: Analytical chemistry, 1995, p. 1530-1535.

Research output: Contribution to journalArticleResearchpeer-review

Bibtex - Download

@article{7bdc526156c34fb4ac54bb045fd7b2bf,
title = "AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy",
author = "Thomas Prohaska and G FRIEDBACHER and M GRASSERBAUER",
year = "1995",
language = "English",
pages = "1530--1535",
journal = "Analytical chemistry",
issn = "0003-2700",
publisher = "American Chemical Society",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy

AU - Prohaska, Thomas

AU - FRIEDBACHER, G

AU - GRASSERBAUER, M

PY - 1995

Y1 - 1995

M3 - Article

SP - 1530

EP - 1535

JO - Analytical chemistry

JF - Analytical chemistry

SN - 0003-2700

ER -