AFM and STM studies on In2O3 and ITO thin films deposited by Atomic Layer Epitaxy

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AFM and STM studies on In2O3 and ITO thin films deposited by Atomic Layer Epitaxy. / Prohaska, Thomas; FRIEDBACHER, G.
In: Applied surface science, 1996, p. 91-98.

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@article{f5fd192f237a4989aca082ff434e3dba,
title = "AFM and STM studies on In2O3 and ITO thin films deposited by Atomic Layer Epitaxy",
author = "Thomas Prohaska and G FRIEDBACHER",
year = "1996",
language = "English",
pages = "91--98",
journal = "Applied surface science",
issn = "0169-4332",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - AFM and STM studies on In2O3 and ITO thin films deposited by Atomic Layer Epitaxy

AU - Prohaska, Thomas

AU - FRIEDBACHER, G

PY - 1996

Y1 - 1996

M3 - Article

SP - 91

EP - 98

JO - Applied surface science

JF - Applied surface science

SN - 0169-4332

ER -