Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

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Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy. / Zhang, Zaoli; Daniel, Rostislav; Dehm, Gerhard et al.
2011. Poster session presented at Microscopy Conference (MC2011), Kiel, Germany.

Research output: Contribution to conferencePosterResearchpeer-review

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@conference{b690cef19b404938951b626620778e49,
title = "Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy",
author = "Zaoli Zhang and Rostislav Daniel and Gerhard Dehm and Christian Mitterer",
year = "2011",
language = "English",
note = "Microscopy Conference (MC2011) ; Conference date: 28-08-2011 Through 02-09-2011",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

AU - Zhang, Zaoli

AU - Daniel, Rostislav

AU - Dehm, Gerhard

AU - Mitterer, Christian

PY - 2011

Y1 - 2011

M3 - Poster

T2 - Microscopy Conference (MC2011)

Y2 - 28 August 2011 through 2 September 2011

ER -