Karl Christian Teichert
Research output
- Published
Controlling molecular orientation of OMBE grown 6P thin films on mica(001)
Hlawacek, G., Quan, S., Teichert, C., Resel, R. & Smilgies, D. M., 2007, In: Surface Science. 601, p. 2584-2587Research output: Contribution to journal › Article › Research › peer-review
- Published
Controllable formation of nanoscale molecular structures on rutileTiO2(110): From highly anisotropic nanoneedles to dendritic islands
Wrana, D., Szajna, K., Kratzer, M., Belza, W., Jany, B. R., Teichert, C. & Krok, F., 25 Feb 2018.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Contact angle measurements on coated samples
Ganser, C., Schmied, F. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Contact angle and AFM roughness measurements of polymer coated steel samples
Lugger, M. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3Research output: Contribution to journal › Article › Research › peer-review
- Published
Conductive Atomic Force Microscopy investigations of organic thin films
Pavitschitz, A., Beinik, I., Kratzer, M., Teichert, C., Schwabegger, G., Sitter, H., Simbrunner, C., Grießer, T. & Kern, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Conductive-AFM measurements on cross sectional samples
Andreev, A. & Teichert, C., 2005Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Comprehensive investigation of the viscoelastic properties of PMMA by nanoindentation
Christöfl, P., Czibula, C., Berer, M., Oreski, G., Teichert, C. & Pinter, G., 27 Nov 2020, In: Polymer Testing. 93.2021, January, 9 p., 106978.Research output: Contribution to journal › Article › Research › peer-review
