Karl Christian Teichert
Research output
- 2011
- Published
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Contact angle and AFM roughness measurements of polymer coated steel samples
Lugger, M. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Contact angle measurements on coated samples
Ganser, C., Schmied, F. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling
Lorbek, S., Teichert, C. & Hlawacek, G., 2011, In: European physical journal, The / Applied physics : EPJ. 55, p. 23902-1-23902-5Research output: Contribution to journal › Article › Research › peer-review
- Published
Diffusion and submonolayer growth of para-sexiphenyl on Ir(111) and Ir(111)-supported graphene
Hlawacek, G., Khokar, F. S., van Gastel, R., Teichert, C. & Poelsema, B., 2011, In: IBM journal of research and development [Elektronische Ressource]. 55, p. 15:1-15:7Research output: Contribution to journal › Article › Research › peer-review
- Published
Effect of Ge nanoislandson lateral photoconductivity of Ge-SiOx-Si structures
Lysenko, V. S., Gomeniuk, Y. V., Kozyrev, Y. N., Rubezhanska, M. Y., Sklyar, V. K., Kondratenko, S. V., Melnichuk, Y. Y. & Teichert, C., 2011, Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices: selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24 - 28 October, 2010 Kyiv, Ukraine . p. 179-186 (Advanced materials research; vol. 276).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical Transport of Single ZnO Nanorods studied by Photo- Conductive AFM
Kratzer, M., Beinik, I., Teichert, C., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Elektrische Eigenschaften von Dünnfilmen auf der Nanoskala
Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Epitaxially Grown Films of Standing and Lying Pentacene Molecules on Cu(110) Surfaces
Djuric, T., Ules, T., Flesch, H.-G., Plank, H., Shen, Q., Teichert, C., Resel, R. & Ramsey, M. G., 2011, In: Crystal growth & design. 11, p. 1015-1020Research output: Contribution to journal › Article › Research › peer-review
