Karl Christian Teichert

181 - 190 out of 507Page size: 10

Research output

  1. 2009
  2. Published

    Conductive Atomic Force Microscopy investigations of organic thin films

    Pavitschitz, A., Beinik, I., Kratzer, M., Teichert, C., Schwabegger, G., Sitter, H., Simbrunner, C., Grießer, T. & Kern, W., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  3. Published

    Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

    Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Defektbildung und Ladungsträgereinfang in epitaktisch gewachsenen organischen Nanostrukturen

    Teichert, C., 2009

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  5. Published

    Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

    Shen, Q., Hlawacek, G., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Ehrlich Schwoebel barriers in organic thin film growth

    Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Elektrische Eigenschaften von Dünnfilmen auf der Nanoskala

    Teichert, C., 2009

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  8. Published

    Exploring fundamental growth morphologies in organic thin film systems

    Teichert, C., 2009

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  9. Published

    Hierarchy of adhesion forces in patterns of photoreactive surface layers

    Hlawacek, G., Shen, Q., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2009, In: Journal of chemical physics (The journal of chemical physics). 130, p. 44703-1-44703-5

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    High Resolution RBS on High-k Dielectrics

    Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  11. Published

    In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

    Teichert, C. (Editor), 2009, Eigenverlag.

    Research output: Book/Report › Anthology › Research

Previous 1...15 16 17 18 19 20 21 22 ...51 Next
View graph of relations

Contact

Phone: 4663

Latest Research Output

View more (507)