Igor Beinik
(Former)
11 - 20 out of 28Page size: 10
Research output
- Published
Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns
Lang, W., Marksteiner, M., Bodea, M. A., Siraj, K., Pedarnig, J. D., Kolarova, R., Bauer, P., Hasengrübler, K., Hasenfuss, C., Beinik, I. & Teichert, C., 2012, In: Nuclear instruments & methods in physics research / B Beam interactions with materials and atoms. 272, p. 300-304Research output: Contribution to journal › Article › Research › peer-review
- Published
Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurišić, A. B., 1 Oct 2012, In: Journal of applied physics. 112.2012, 7, 1 p., 079903.Research output: Contribution to journal › Comment/debate › peer-review
- Published
Electrical Transport of Single ZnO Nanorods studied by Photo- Conductive AFM
Kratzer, M., Beinik, I., Teichert, C., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Electrical Characterization of Semiconductor Nanostructures by Conductive Probe Based Atomic Force Microscopy Techniques
Beinik, I., 2011, 118 p.Research output: Thesis › Doctoral Thesis
- Published
Electrical and photovoltaic properties of self assembled Ge nanodomes on Si(001)
Kratzer, M., Prehal, C., Rubezhanska, M., Beinik, I., Kondratenko, S., Kozyrev, Y. & Teichert, C., 2012, In: Physical review : B, Condensed matter and materials physics. 86, p. 245320-1-245320-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3Research output: Contribution to journal › Article › Research › peer-review
- Published
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
