Daniel Kiener

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Research output

  1. 2006
  2. Published

    Determination of Mechanical Properties of Copper at the Micron Scale

    Kiener, D., Motz, C., Schöberl, T., Jenko, M. & Dehm, G., 2006, In: Advanced engineering materials. 8, p. 1119-1125

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    In-Situ compression tests on micron-sized copper pillars

    Kiener, D., Motz, C. & Dehm, G., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism

    Oh, S. H., Kiener, D., Legros, M., Gruber, P., Arzt, E. & Dehm, G., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Micron beam bending and compression tests - micromechanical properties of copper

    Motz, C., Kiener, D., Schöberl, T. & Dehm, G., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Microstructural evolution of the deformed volume beneath microindents in tungsten and copper

    Kiener, D., Pippan, R., Motz, C. & Kreuzer, E., 2006, In: Acta materialia. 54, p. 2801-2811

    Research output: Contribution to journal › Article › Research › peer-review

  7. Published

    Microstructural investigation of the deformation zone below nanoindents in copper, silver and nickel

    Rester, M., Kiener, D., Kreuzer, H., Dehm, G. & Motz, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. 2007
  9. Published

    Characterization of mechanical properties on the micron size. Bericht 1

    Kiener, D. & Dehm, G., 2007

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  10. Published

    Characterization of mechanical properties on the micron size. Bericht 2

    Kiener, D. & Dehm, G., 2007

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  11. Published

    Conventional TEM investigation of the FIB damage in copper

    Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101

    Research output: Contribution to journal › Article › Research › peer-review

  12. Published

    Conventional TEM Investigation of the FIB Damage in Copper

    Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, Microscopy Conference, International Forum for Advanced Microscopy. p. 100-101

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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