Daniel Kiener

Activities

  1. 2024
  2. Ondrej Adam

    Kiener, D. (Host)

    1 Jul 202430 Aug 2024

    Activity: Hosting a visitorHosting an academic visitor

  3. Miniaturized in situ experiments to probe local interface reliability

    Kiener, D. (Speaker)

    7 Jun 2024

    Activity: Talk or presentation Oral presentation

  4. Evolution of stress fields during crack growth and arrest in micro-cantilevers during in situ bending assessed by cross-sectional X-ray nanodiffraction

    Meindlhumer, M. (Speaker), Alfreider, M. (contributor), Burghammer, M. (contributor), Rosenthal, M. (contributor), Daniel, R. (contributor), Hohenwarter, A. (contributor), Mitterer, C. (contributor), Todt, J. (contributor), Kiener, D. (contributor) & Keckes, J. (Speaker)

    6 Jun 2024

    Activity: Talk or presentation Oral presentation

  5. Micro- and nanomechanical in situ investigations of distinct interfaces

    Burtscher, M. (Speaker), Alfreider, M. (contributor), Fellner, S. (contributor), Gammer, C. (contributor) & Kiener, D. (contributor)

    6 Jun 2024

    Activity: Talk or presentation Invited talk

  6. Mechanical processing and thermal stability of the equiatomic high entropy alloy TiVZrNbHf under vacuum and hydrogen

    Schweiger, L. (Speaker), Römer, F. (contributor), Gizer, G. (contributor), Kiener, D. (contributor), Pistidda, C. (contributor), Schökel, A. (contributor), Spieckermann, F. (contributor) & Eckert, J. (contributor)

    6 May 2024

    Activity: Talk or presentation Oral presentation

  7. 25 Jahre Johanneum Research Materials

    Kiener, D. (Participant)

    1 May 20243 May 2024

    Activity: Participating in or organising an eventParticipation in conference

  8. 2. MecaNano General Meeting

    Kiener, D. (Participant)

    1 May 20243 May 2024

    Activity: Participating in or organising an eventParticipation in conference

  9. Sebastian Lam

    Kiener, D. (Host)

    29 Apr 202423 Aug 2024

    Activity: Hosting a visitorHosting an academic visitor

  10. Mechanical Reliability of Microelectronic Components: Testing Single Crystals from Micro to Macro Scale

    Gruber, M. (Speaker), Supancic, P. H. (contributor), Kiener, D. (contributor) & Bermejo, R. (contributor)

    17 Apr 202419 Apr 2024

    Activity: Talk or presentation Oral presentation

  11. Overcoming the FIB bottleneck: High throughput nanomechanical testing

    Kiener, D. (Speaker), Jelinek, A. (contributor), Alfreider, M. (contributor), Žák, S. (contributor), Cordill, M. J. (contributor), Schlögl, S. (contributor), Rossegger, E. (contributor), Brescakovic, D. (contributor) & Kolednik, O. (contributor)

    17 Apr 2024

    Activity: Talk or presentation Oral presentation

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