Departments and Chairs

Organisational unit: Departments and Institutes

Research output

  1. Published

    XIV.Medunarodni Simpozij Gospodarenje Otpadom Zagreb 2016

    Sarc, R. & Pomberger, R., 28 Nov 2016, XIV.Medunarodni Simpozij Gospodarenje Otpadom Zagreb 2016. Anic Vucinin, A. (ed.). Sv. I. Zelina, p. 56 - 57 13 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  2. Published

    X-Legierungen: Ein großer Schritt in Richtung Einheitslegierung

    Stemper, L., 2020, AluReport. Vol. 02.2020. p. 40-43

    Research output: Chapter in Book/Report/Conference proceedingOther chapter contributionResearch

  3. Published

    xP-frag, a distribution-free model to predict blast fragmentation

    Sanchidrián, J. A. & Ouchterlony, F., 29 Jan 2017, Proc 43rd ISEE Conference on Explosives and Blasting Technique. Cleveland, OH, Vol. 43. p. 265-280 16 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  4. Published

    xP-frag: a new model to predict fragmentation from blasting

    Sanchidrián, J. A. & Ouchterlony, F., 2017, APS Blasting 5; New development on engineerign blasting: Proc 5th Asia-Pacific Symposium on Blasting Techniques . Wang, X. (ed.). Beijing, China, p. 31-36 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  5. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    X-ray based tools for the investigation of buried interfaces in organic electronic devices

    Neuhold, A., Brandner, H., Ausserlechner, S. J., Lorbek, S., Neuschitzer, M., Zojer, E., Teichert, C. & Resel, R., 2013, In: Organic electronics. 14, p. 479-487

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    X-ray characterization of semiconductor nanostructures

    Holy, V., Buljan, M. & Lechner, R. T., 2011, In: Semiconductor science and technology. 26, p. 064002/1- 064002/7

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    X-Ray computed tomography – Potenials, expectations and limits in practical application

    Schindelbacher, G., Pabel, T. & Geier, G., 2007, In: Casting plant and technology international. p. 34-41

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published
  10. Published

    X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel

    Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777

    Research output: Contribution to journalArticleResearchpeer-review