Departments and Chairs
Organisational unit: Departments and Institutes
Research output
- Published
XIV.Medunarodni Simpozij Gospodarenje Otpadom Zagreb 2016
Sarc, R. & Pomberger, R., 28 Nov 2016, XIV.Medunarodni Simpozij Gospodarenje Otpadom Zagreb 2016. Anic Vucinin, A. (ed.). Sv. I. Zelina, p. 56 - 57 13 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
X-Legierungen: Ein großer Schritt in Richtung Einheitslegierung
Stemper, L., 2020, AluReport. Vol. 02.2020. p. 40-43Research output: Chapter in Book/Report/Conference proceeding › Other chapter contribution › Research
- Published
xP-frag, a distribution-free model to predict blast fragmentation
Sanchidrián, J. A. & Ouchterlony, F., 29 Jan 2017, Proc 43rd ISEE Conference on Explosives and Blasting Technique. Cleveland, OH, Vol. 43. p. 265-280 16 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
xP-frag: a new model to predict fragmentation from blasting
Sanchidrián, J. A. & Ouchterlony, F., 2017, APS Blasting 5; New development on engineerign blasting: Proc 5th Asia-Pacific Symposium on Blasting Techniques . Wang, X. (ed.). Beijing, China, p. 31-36 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray based tools for the investigation of buried interfaces in organic electronic devices
Neuhold, A., Brandner, H., Ausserlechner, S. J., Lorbek, S., Neuschitzer, M., Zojer, E., Teichert, C. & Resel, R., 2013, In: Organic electronics. 14, p. 479-487Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray characterization of semiconductor nanostructures
Holy, V., Buljan, M. & Lechner, R. T., 2011, In: Semiconductor science and technology. 26, p. 064002/1- 064002/7Research output: Contribution to journal › Article › Research › peer-review
- Published
X-Ray computed tomography – Potenials, expectations and limits in practical application
Schindelbacher, G., Pabel, T. & Geier, G., 2007, In: Casting plant and technology international. p. 34-41Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray Curing of Organic Bonded High Temperature Resistant Ceramics
Puchleitner, R., 2016Research output: Thesis › Doctoral Thesis
- Published
X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review