Department Physics, Mechanics and Electrical Engineering
Organisational unit: Departments and Institutes
Research output
- Published
Concept for a General Formulation of Simulation Models
Oberaigner, E., 1986Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Concepts for E-Assessments in STEM on the Example of Engineering Mechanics: How to Assess Complex EngineeringProblemsElectronically
Orthaber, M., Stütz, D., Antretter, T. & Ebner, M., 26 Jun 2020, In: International journal emerging technologies in learning : iJET. 15.2020, 12, p. 136-152 17 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Condition Monitoring and Damage Prediction in Railway Applications
Velic, D., 2022Research output: Thesis › Doctoral Thesis
- Published
Conductance and Temperature Measurement System for 1500°C Metallurgical Slag
Korp, J., Maier, W., Schmid, A. & Weiß, H., 2004, Proceedings of the 7th International Symposium on Actual Problems of Eelctronic Instrument Engineering. p. 178-182Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Conductance fluctuations in PbTe wide parabolic quantum wells
Oswald, J., Heigl, G., Span, G., Homer, A., Ganitzer, P., Maude, D. K. & Portal, J. C., 1996, In: Physica B: Condensed Matter. 227, 1, p. 360-362Research output: Contribution to journal › Article › Research › peer-review
- Published
Conductance Fluctuations in PbTe Wide Parabolic Quantum Wells
Oswald, J., Heigl, G., Span, G., Homer, A., Ganitzer, P., Maude, D. K. & Portal, J. C., 1995.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Conductive-AFM measurements on cross sectional samples
Andreev, A. & Teichert, C., 2005Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. p. 691-721Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Conductive Atomic Force Microscopy investigations of organic thin films
Pavitschitz, A., Beinik, I., Kratzer, M., Teichert, C., Schwabegger, G., Sitter, H., Simbrunner, C., Grießer, T. & Kern, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
