Microstructure and mechanical properties of a heat-treatable Al-3.5Cu-1.5Mg-1Si alloy produced by selective laser melting

Wang, P., Gammer, C., Brenne, F., Prashanth, K. G., Mendes, R. G., Rümmeli, M. H., Gemming, T., Eckert, J. & Scudino, S., 10 Jan 2018, In: Materials science and engineering: A, Structural materials: properties, microstructure and processing. 711.2018, January, p. 562-570 9 p.

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Electrically reversible cracks in an intermetallic film controlled by an electric field

Liu, Z. Q., Liu, J. H., Biegalski, M. D., Hu, J-M., Shang, S. L., Ji, Y., Wang, J. M., Hsu, S. L., Wong, A. T., Cordill, M., Gludovatz, B., Marker, C., Yan, H., Feng, Z. X., You, L., Lin, M. W., Ward, T. Z., Liu, Z. K., Jiang, C. B., Chen, L. Q., & 3 othersRitchie, R. O., Christen, H. M. & Ramesh, R., 3 Jan 2018, In: Nature Communications. 41.2018, 9, 7 p., 9.

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Nanoindentation creep behavior of Cu–Zr metallic glass films

Wang, Y., Zhang, J., Wu, K., Liu, G., Kiener, D. & Sun, J., 2 Jan 2018, In: Materials Research Letters [Elektronische Ressource]. 6.2018, 1, p. 22-28 7 p.

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MnFePSi-Based Magnetocaloric Packed Bed Regenerators: Structural Details Probed by X-Ray Tomography: Structural details probed by X-ray tomography

Funk, A., Zeilinger, M., Miehe, A., Sopu, D., Eckert, J., Dötz, F. & Waske, A., 1 Jan 2018, In: Chemical engineering science : Génie chimique. 175.2018, 16 January, p. 84-90 7 p.

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Thermodynamic instability of a nanocrystalline, single-phase TiZrNbHfTa alloy and its impact on the mechanical properties

Schuh, B., Völker, B., Todt, J., Schell, N., Perrière, L., Li, J., Couzinié, J. P. & Hohenwarter, A., 1 Jan 2018, In: Acta materialia. 142.2018, 1 January, p. 201-212 12 p.

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High strength nanostructured Al-based alloys through optimized processing of rapidly quenched amorphous precursors

Kim, S. Y., Lee, G. Y., Park, G. H., Kim, H. A., Lee, A. Y., Scudino, S., Prashanth, K. G., Kim, D. H., Eckert, J. & Lee, M. H., Jan 2018, (E-pub ahead of print) In: Scientific reports (London : Nature Publishing Group). 8.2018, 12 p., 1090.

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30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiO_x thin film

Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873

Research output: Contribution to journal › Article › Research › peer-review