Review of scientific instruments, 0034-6748
Journal
| ISSNs | 0034-6748 |
|---|
11 - 12 out of 12Page size: 10
Research output
- Published
Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
Bennett, S. E., Holec, D., Kappers, M. J., Humphreys, C. J. & Oliver, R. A., 2010, In: Review of scientific instruments. p. 0637011-0637017Research output: Contribution to journal › Article › Research › peer-review
- Published
A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device
Abboud, A., Kirchlechner, C., Send, S., Micha, J. S., Ulrich, O., Pashniak, N., Strüder, L. W. J., Keckes, J. & Pietsch, U., 2014, In: Review of scientific instruments. 85, p. 1139011-1139018Research output: Contribution to journal › Article › Research › peer-review
