Microscopy and microanalysis, 1431-9276
Journal
ISSNs | 1431-9276 |
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Research output
- Published
Sensitivity and Quantitativity in Atom Probe Tomography
Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M. & Danoix, R., 2009, In: Microscopy and microanalysis. p. 258-259Research output: Contribution to journal › Article › Research › peer-review
- Published
Quantitative Approaches for in situ SEM and TEM Deformation Studies
Dehm, G., Kiener, D., Motz, C., Pippan, R. & Smolka, M., 2012, In: Microscopy and microanalysis. 18, p. 736-737Research output: Contribution to journal › Article › Research › peer-review
- Published
Atom probe tomography for isotopic analysis: development of the 34S/32S system in sulfides
Gopon, P., Douglas, J., Meisenkothen, F., Singh, J., London, A. & Moody, M., 2021, In: Microscopy and microanalysis.Research output: Contribution to journal › Article › Research › peer-review
- Published
Diagenetic Evolution and Reservoir Quality of Sandstones in the North Alpine Foreland Basin: A Microscale Approach
Groß, D., Grundtner, M.-L., Misch, D., Riedl, M., Sachsenhofer, R. & Scheucher, L., 6 Jun 2015, In: Microscopy and microanalysis. 21, 5, 15 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Extreme ductility at the nanoscale in Fe-based alloys
Hintsala, E., Kiener, D. & Gerberich, W. W., 1 Aug 2014, In: Microscopy and microanalysis. 20, 3, p. 1876-1877 2 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Lock-In Infrared Microscopy on ZnO Ceramics - A Complementary Investigation Technique for the Analysis of Functional Electroceramic Components
Hofstätter, M., Raidl, N., Sartory, B. & Supancic, P., 2015, In: Microscopy and microanalysis. 21, p. 1145-1152 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Linking Macroscopic Fracture Properties to Single Dislocation Processes
Issa, I., Alfreider, M., Kozic, D., Kolednik, O., Sandfeld, S. & Kiener, D., Aug 2018, In: Microscopy and microanalysis. 24.2018, Supplement S1, p. 2184-2185 2 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Conventional TEM investigation of the FIB damage in copper
Kiener, D., Jörg, T., Rester, M., Motz, C. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 100-101Research output: Contribution to journal › Article › Research › peer-review
- Published
Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing
Lowry, M. B., Kiener, D., Le Blanc, B. B., Chisholm, C., Florando, J. N., Morris, J. W. J. & Minor, A. M., 2010, In: Microscopy and microanalysis. 16, p. 1748-1749Research output: Contribution to journal › Article › Research › peer-review
- Published
Connecting in situ TEM mechanical testing with bulk properties of irradiated materials
Minor, A. M., Hosemann, P. & Kiener, D., 2012, In: Microscopy and microanalysis. 18, p. 1344-1345Research output: Contribution to journal › Article › Research › peer-review