Journal of applied crystallography, ‎0021-8898

Journal

ISSNs0021-8898, 1600-5767

Research output

  1. Published
  2. Published

    Simultaneous determination of experimental elastic and thermal strains in thin films

    Keckes, J., 2005, In: Journal of applied crystallography. 38, p. 311-318

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Symmetry properties and transformation behaviour of the X-ray stress factors

    Ortner, B., 2006, In: Journal of applied crystallography. 39, p. 401-409

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published
  5. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journalArticleResearchpeer-review

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