X-ray based tools for the investigation of buried interfaces in organic electronic devices
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in: Organic electronics, Jahrgang 14, 2013, S. 479-487.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - X-ray based tools for the investigation of buried interfaces in organic electronic devices
AU - Neuhold, Alfred
AU - Brandner, Hannes
AU - Ausserlechner, Simon J.
AU - Lorbek, Stefan
AU - Neuschitzer, Markus
AU - Zojer, Egbert
AU - Teichert, Christian
AU - Resel, Roland
PY - 2013
Y1 - 2013
U2 - 10.1016/j.orgel.2012.11.016
DO - 10.1016/j.orgel.2012.11.016
M3 - Article
VL - 14
SP - 479
EP - 487
JO - Organic electronics
JF - Organic electronics
SN - 1566-1199
ER -