X-ray based tools for the investigation of buried interfaces in organic electronic devices

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X-ray based tools for the investigation of buried interfaces in organic electronic devices. / Neuhold, Alfred; Brandner, Hannes; Ausserlechner, Simon J. et al.
in: Organic electronics, Jahrgang 14, 2013, S. 479-487.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Neuhold A, Brandner H, Ausserlechner SJ, Lorbek S, Neuschitzer M, Zojer E et al. X-ray based tools for the investigation of buried interfaces in organic electronic devices. Organic electronics. 2013;14:479-487. doi: 10.1016/j.orgel.2012.11.016

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Neuhold, Alfred ; Brandner, Hannes ; Ausserlechner, Simon J. et al. / X-ray based tools for the investigation of buried interfaces in organic electronic devices. in: Organic electronics. 2013 ; Jahrgang 14. S. 479-487.

Bibtex - Download

@article{f17df63e2c0f4185bee489f871d8573c,
title = "X-ray based tools for the investigation of buried interfaces in organic electronic devices",
author = "Alfred Neuhold and Hannes Brandner and Ausserlechner, {Simon J.} and Stefan Lorbek and Markus Neuschitzer and Egbert Zojer and Christian Teichert and Roland Resel",
year = "2013",
doi = "10.1016/j.orgel.2012.11.016",
language = "English",
volume = "14",
pages = "479--487",
journal = "Organic electronics",
issn = "1566-1199",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - X-ray based tools for the investigation of buried interfaces in organic electronic devices

AU - Neuhold, Alfred

AU - Brandner, Hannes

AU - Ausserlechner, Simon J.

AU - Lorbek, Stefan

AU - Neuschitzer, Markus

AU - Zojer, Egbert

AU - Teichert, Christian

AU - Resel, Roland

PY - 2013

Y1 - 2013

U2 - 10.1016/j.orgel.2012.11.016

DO - 10.1016/j.orgel.2012.11.016

M3 - Article

VL - 14

SP - 479

EP - 487

JO - Organic electronics

JF - Organic electronics

SN - 1566-1199

ER -