Two frequency time-of-flight three-dimensional image sensor and method of measuring object depth
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Patent Nr.: US10382736B1. Aug. 13, 2019.
Publikationen: Patent › Patentschrift
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TY - PAT
T1 - Two frequency time-of-flight three-dimensional image sensor and method of measuring object depth
AU - Thurner, Thomas
PY - 2019/8/13
Y1 - 2019/8/13
N2 - A three-dimensional image system includes a modulator configured to generate a first and a second modulation signal having a predetermined frequency difference, an illumination source configured to generate a light signal modulated by the first modulation signal, and a pixel array modulated by the second modulation signal. At least one pixel of the pixel array is configured to receive a reflected modulated light signal and generate a plurality of measurement signals based on a plurality of image acquisitions taken at different acquisition times. A controller is configured to control a phase difference between the first modulation signal and the second modulation signal by setting the first modulation frequency and the second modulation frequency to have a predetermined frequency difference greater than zero; and calculate a depth of the object based on the plurality of measurement signals, the depth being a distance from the 3DI system to the object.
AB - A three-dimensional image system includes a modulator configured to generate a first and a second modulation signal having a predetermined frequency difference, an illumination source configured to generate a light signal modulated by the first modulation signal, and a pixel array modulated by the second modulation signal. At least one pixel of the pixel array is configured to receive a reflected modulated light signal and generate a plurality of measurement signals based on a plurality of image acquisitions taken at different acquisition times. A controller is configured to control a phase difference between the first modulation signal and the second modulation signal by setting the first modulation frequency and the second modulation frequency to have a predetermined frequency difference greater than zero; and calculate a depth of the object based on the plurality of measurement signals, the depth being a distance from the 3DI system to the object.
M3 - Patent
M1 - US10382736B1
ER -
