Transient Temperature and Substrate Distortion Analysis Induced by Wire Arc Additive Manufacturing of SS316L using Experiment and FEM with Simplified Bead Model
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72nd IIW Annual Assembly and International Conference: Conference Proceedings. 2019.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
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TY - GEN
T1 - Transient Temperature and Substrate Distortion Analysis Induced by Wire Arc Additive Manufacturing of SS316L using Experiment and FEM with Simplified Bead Model
AU - Nursyahirah Binti Ahmad , Siti
AU - Manurung, Yupiter
AU - Faiz Mat, Muhd.
AU - Minggu, Zaidi
AU - Helena Sipi Anak Pengadau , Fetisia
AU - Prüller, Simon
AU - Leitner, Martin
PY - 2019
Y1 - 2019
M3 - Conference contribution
BT - 72nd IIW Annual Assembly and International Conference
ER -