Technology-metals: Source characterization and assessment of environmental exposure

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Standard

Technology-metals: Source characterization and assessment of environmental exposure. / Irrgeher, Johanna; Prohaska, Thomas; Pitha, Ulrike et al.
2019. Postersitzung präsentiert bei CANAS 2019, Freiberg, Deutschland.

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Harvard

Irrgeher, J, Prohaska, T, Pitha, U, Scharf, B & Gonzalez, J 2019, 'Technology-metals: Source characterization and assessment of environmental exposure', CANAS 2019, Freiberg, Deutschland, 23/09/19 - 26/09/19.

APA

Irrgeher, J., Prohaska, T., Pitha, U., Scharf, B., & Gonzalez, J. (2019). Technology-metals: Source characterization and assessment of environmental exposure. Postersitzung präsentiert bei CANAS 2019, Freiberg, Deutschland.

Vancouver

Irrgeher J, Prohaska T, Pitha U, Scharf B, Gonzalez J. Technology-metals: Source characterization and assessment of environmental exposure. 2019. Postersitzung präsentiert bei CANAS 2019, Freiberg, Deutschland.

Author

Irrgeher, Johanna ; Prohaska, Thomas ; Pitha, Ulrike et al. / Technology-metals: Source characterization and assessment of environmental exposure. Postersitzung präsentiert bei CANAS 2019, Freiberg, Deutschland.

Bibtex - Download

@conference{0352dd0ccaf2427e9d21a4ae2024e7e3,
title = "Technology-metals: Source characterization and assessment of environmental exposure",
keywords = "Technologisch kritische Elemente, LA-ICP-MS, Electronic scrap",
author = "Johanna Irrgeher and Thomas Prohaska and Ulrike Pitha and Bernhard Scharf and Jhanis Gonzalez",
year = "2019",
month = sep,
day = "23",
language = "English",
note = "CANAS 2019 ; Conference date: 23-09-2019 Through 26-09-2019",
url = "https://tu-freiberg.de/canas",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Technology-metals: Source characterization and assessment of environmental exposure

AU - Irrgeher, Johanna

AU - Prohaska, Thomas

AU - Pitha, Ulrike

AU - Scharf, Bernhard

AU - Gonzalez, Jhanis

PY - 2019/9/23

Y1 - 2019/9/23

KW - Technologisch kritische Elemente

KW - LA-ICP-MS

KW - Electronic scrap

M3 - Poster

T2 - CANAS 2019

Y2 - 23 September 2019 through 26 September 2019

ER -