SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES
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SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES. / O'Leary, Paul (Erfinder); Oswald-Tranta, Beata (Erfinder).
Juni 19, 2008.
Juni 19, 2008.
Publikationen: Patent › Patentschrift
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O'Leary P, Oswald-Tranta B, Erfinder/-innen. SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES. 2008 Jun 19.
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@misc{2bf33706693644a8b905b145cd5a97ab,
title = "SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES",
author = "Paul O'Leary and Beata Oswald-Tranta",
year = "2008",
month = jun,
day = "19",
language = "English",
type = "Patent",
note = "G01B11/04",
}
RIS (suitable for import to EndNote) - Download
TY - PAT
T1 - SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES
AU - O'Leary, Paul
AU - Oswald-Tranta, Beata
PY - 2008/6/19
Y1 - 2008/6/19
UR - https://worldwide.espacenet.com/publicationDetails/inpadocPatentFamily?CC=EP&NR=2102639A1&KC=A1&FT=D&ND=3&date=20090923&DB=EPODOC&locale=de_EP
M3 - Patent
ER -
