Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity. / Putz, Barbara; Milkovič, O.; Mohanty, G. et al.
in: Materials and Design, Jahrgang 218.2022, Nr. June, 110675, 06.2022.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Harvard

Putz, B, Milkovič, O, Mohanty, G, Ipach, R, Pethö, L, Milkovičová, J, Maeder, X, Edwards, TEJ, Schweizer, P, Coduri, M, Saksl, K & Michler, J 2022, 'Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity', Materials and Design, Jg. 218.2022, Nr. June, 110675. https://doi.org/10.1016/j.matdes.2022.110675

APA

Putz, B., Milkovič, O., Mohanty, G., Ipach, R., Pethö, L., Milkovičová, J., Maeder, X., Edwards, T. E. J., Schweizer, P., Coduri, M., Saksl, K., & Michler, J. (2022). Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity. Materials and Design, 218.2022(June), Artikel 110675. https://doi.org/10.1016/j.matdes.2022.110675

Vancouver

Putz B, Milkovič O, Mohanty G, Ipach R, Pethö L, Milkovičová J et al. Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity. Materials and Design. 2022 Jun;218.2022(June):110675. doi: 10.1016/j.matdes.2022.110675

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@article{e5d0f7b9307f4e0b88cf04bd57d079cb,
title = "Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity",
abstract = "We report for the first-time combinatorial synthesis of thin film metallic glass libraries via magnetron co-sputtering at the limit of crystallinity. Special care was taken to prepare extremely pure CuZr films (1–2 µm thickness) with large compositional gradients (Cu18.2Zr81.8 to Cu74.8Zr25.2) on X-ray transparent polymer substrates in high-vacuum conditions. Combined mapping of atomic structure (synchrotron radiation) and chemical composition (X-ray fluorescence spectroscopy) revealed that over the entire composition range, covering multiple renowned glass formers, two phases are present in the film. Our high-resolution Synchrotron approach identified the two phases as: untextured amorphous Cu51Zr14 (cluster size 1.3 nm) and textured, nanocrystalline α-Zr (grain size 1–5 nm). Real space HR-STEM analyses of a representative composition substantiate our XRD results. Determined cluster and grain sizes are below the resolution limit of conventional laboratory-scale X-ray diffractometers. The presented phase mixture is not permitted in the Cu-Zr phase diagram and contrary to existing literature. The phase ratio follows a linear trend with amorphous films on the Cu-rich side and increasing amounts of α-Zr with increasing Zr content. While cluster size and composition of the amorphous phase remain constant thorough the compositional gradient, crystallite size and texture of the nanocrystalline α-Zr change as a function of Zr content.",
keywords = "Combinatorial materials science, Magnetron sputtering, Structure analysis, TEM, Thin film metallic glass, X-ray diffraction",
author = "Barbara Putz and O. Milkovi{\v c} and G. Mohanty and R. Ipach and L. Peth{\"o} and J. Milkovi{\v c}ov{\'a} and X. Maeder and Edwards, {T. E.J.} and P. Schweizer and M. Coduri and K. Saksl and J. Michler",
note = "Publisher Copyright: {\textcopyright} 2022 The Authors",
year = "2022",
month = jun,
doi = "10.1016/j.matdes.2022.110675",
language = "English",
volume = "218.2022",
journal = "Materials and Design",
issn = "0264-1275",
publisher = "Elsevier",
number = "June",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Structural characterisation of Cu-Zr thin film combinatorial libraries with synchrotron radiation at the limit of crystallinity

AU - Putz, Barbara

AU - Milkovič, O.

AU - Mohanty, G.

AU - Ipach, R.

AU - Pethö, L.

AU - Milkovičová, J.

AU - Maeder, X.

AU - Edwards, T. E.J.

AU - Schweizer, P.

AU - Coduri, M.

AU - Saksl, K.

AU - Michler, J.

N1 - Publisher Copyright: © 2022 The Authors

PY - 2022/6

Y1 - 2022/6

N2 - We report for the first-time combinatorial synthesis of thin film metallic glass libraries via magnetron co-sputtering at the limit of crystallinity. Special care was taken to prepare extremely pure CuZr films (1–2 µm thickness) with large compositional gradients (Cu18.2Zr81.8 to Cu74.8Zr25.2) on X-ray transparent polymer substrates in high-vacuum conditions. Combined mapping of atomic structure (synchrotron radiation) and chemical composition (X-ray fluorescence spectroscopy) revealed that over the entire composition range, covering multiple renowned glass formers, two phases are present in the film. Our high-resolution Synchrotron approach identified the two phases as: untextured amorphous Cu51Zr14 (cluster size 1.3 nm) and textured, nanocrystalline α-Zr (grain size 1–5 nm). Real space HR-STEM analyses of a representative composition substantiate our XRD results. Determined cluster and grain sizes are below the resolution limit of conventional laboratory-scale X-ray diffractometers. The presented phase mixture is not permitted in the Cu-Zr phase diagram and contrary to existing literature. The phase ratio follows a linear trend with amorphous films on the Cu-rich side and increasing amounts of α-Zr with increasing Zr content. While cluster size and composition of the amorphous phase remain constant thorough the compositional gradient, crystallite size and texture of the nanocrystalline α-Zr change as a function of Zr content.

AB - We report for the first-time combinatorial synthesis of thin film metallic glass libraries via magnetron co-sputtering at the limit of crystallinity. Special care was taken to prepare extremely pure CuZr films (1–2 µm thickness) with large compositional gradients (Cu18.2Zr81.8 to Cu74.8Zr25.2) on X-ray transparent polymer substrates in high-vacuum conditions. Combined mapping of atomic structure (synchrotron radiation) and chemical composition (X-ray fluorescence spectroscopy) revealed that over the entire composition range, covering multiple renowned glass formers, two phases are present in the film. Our high-resolution Synchrotron approach identified the two phases as: untextured amorphous Cu51Zr14 (cluster size 1.3 nm) and textured, nanocrystalline α-Zr (grain size 1–5 nm). Real space HR-STEM analyses of a representative composition substantiate our XRD results. Determined cluster and grain sizes are below the resolution limit of conventional laboratory-scale X-ray diffractometers. The presented phase mixture is not permitted in the Cu-Zr phase diagram and contrary to existing literature. The phase ratio follows a linear trend with amorphous films on the Cu-rich side and increasing amounts of α-Zr with increasing Zr content. While cluster size and composition of the amorphous phase remain constant thorough the compositional gradient, crystallite size and texture of the nanocrystalline α-Zr change as a function of Zr content.

KW - Combinatorial materials science

KW - Magnetron sputtering

KW - Structure analysis

KW - TEM

KW - Thin film metallic glass

KW - X-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=85129691943&partnerID=8YFLogxK

U2 - 10.1016/j.matdes.2022.110675

DO - 10.1016/j.matdes.2022.110675

M3 - Article

AN - SCOPUS:85129691943

VL - 218.2022

JO - Materials and Design

JF - Materials and Design

SN - 0264-1275

IS - June

M1 - 110675

ER -