Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing. / Kiener, Daniel; Minor, Andrew M.
in: Nano Letters, Jahrgang 11, 2011, S. 3816-3820.
in: Nano Letters, Jahrgang 11, 2011, S. 3816-3820.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Kiener, D & Minor, AM 2011, 'Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing', Nano Letters, Jg. 11, S. 3816-3820. https://doi.org/10.1021/nl201890s
APA
Kiener, D., & Minor, A. M. (2011). Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing. Nano Letters, 11, 3816-3820. https://doi.org/10.1021/nl201890s
Vancouver
Kiener D, Minor AM. Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing. Nano Letters. 2011;11:3816-3820. doi: 10.1021/nl201890s
Author
Bibtex - Download
@article{c5ff41b5a9594ba4b29fbefee494c610,
title = "Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing",
author = "Daniel Kiener and Minor, {Andrew M.}",
year = "2011",
doi = "10.1021/nl201890s",
language = "English",
volume = "11",
pages = "3816--3820",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Source Truncation and Exhaustion: Insights from Quantitative in situ TEM Tensile Testing
AU - Kiener, Daniel
AU - Minor, Andrew M.
PY - 2011
Y1 - 2011
U2 - 10.1021/nl201890s
DO - 10.1021/nl201890s
M3 - Article
VL - 11
SP - 3816
EP - 3820
JO - Nano Letters
JF - Nano Letters
SN - 1530-6984
ER -
