Selective interface toughness measurements of layered thin films

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Selective interface toughness measurements of layered thin films. / Konetschnik, Ruth; Daniel, Rostislav; Brunner, Roland et al.
in: AIP Advances, Jahrgang 7.2017, Nr. 3, 035307, 09.03.2017.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Bibtex - Download

@article{25548c7240b34eb68b3853546df307cc,
title = "Selective interface toughness measurements of layered thin films",
author = "Ruth Konetschnik and Rostislav Daniel and Roland Brunner and Daniel Kiener",
year = "2017",
month = mar,
day = "9",
doi = "10.1063/1.4978337",
language = "English",
volume = "7.2017",
journal = "AIP Advances",
issn = "2158-3226",
publisher = "American Institute of Physics Publising LLC",
number = "3",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Selective interface toughness measurements of layered thin films

AU - Konetschnik, Ruth

AU - Daniel, Rostislav

AU - Brunner, Roland

AU - Kiener, Daniel

PY - 2017/3/9

Y1 - 2017/3/9

U2 - 10.1063/1.4978337

DO - 10.1063/1.4978337

M3 - Article

VL - 7.2017

JO - AIP Advances

JF - AIP Advances

SN - 2158-3226

IS - 3

M1 - 035307

ER -