Selective interface toughness measurements of layered thin films
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Selective interface toughness measurements of layered thin films. / Konetschnik, Ruth; Daniel, Rostislav; Brunner, Roland et al.
in: AIP Advances, Jahrgang 7.2017, Nr. 3, 035307, 09.03.2017.
in: AIP Advances, Jahrgang 7.2017, Nr. 3, 035307, 09.03.2017.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Konetschnik, R, Daniel, R, Brunner, R & Kiener, D 2017, 'Selective interface toughness measurements of layered thin films', AIP Advances, Jg. 7.2017, Nr. 3, 035307. https://doi.org/10.1063/1.4978337
APA
Konetschnik, R., Daniel, R., Brunner, R., & Kiener, D. (2017). Selective interface toughness measurements of layered thin films. AIP Advances, 7.2017(3), Artikel 035307. https://doi.org/10.1063/1.4978337
Vancouver
Konetschnik R, Daniel R, Brunner R, Kiener D. Selective interface toughness measurements of layered thin films. AIP Advances. 2017 Mär 9;7.2017(3):035307. doi: 10.1063/1.4978337
Author
Bibtex - Download
@article{25548c7240b34eb68b3853546df307cc,
title = "Selective interface toughness measurements of layered thin films",
author = "Ruth Konetschnik and Rostislav Daniel and Roland Brunner and Daniel Kiener",
year = "2017",
month = mar,
day = "9",
doi = "10.1063/1.4978337",
language = "English",
volume = "7.2017",
journal = "AIP Advances",
issn = "2158-3226",
publisher = "American Institute of Physics Publising LLC",
number = "3",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Selective interface toughness measurements of layered thin films
AU - Konetschnik, Ruth
AU - Daniel, Rostislav
AU - Brunner, Roland
AU - Kiener, Daniel
PY - 2017/3/9
Y1 - 2017/3/9
U2 - 10.1063/1.4978337
DO - 10.1063/1.4978337
M3 - Article
VL - 7.2017
JO - AIP Advances
JF - AIP Advances
SN - 2158-3226
IS - 3
M1 - 035307
ER -
