SAMPLE ANALYSIS SYSTEM
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Patent Nr.: WO2010049175. Mai 06, 2010.
Publikationen: Patent › Patentschrift
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TY - PAT
T1 - SAMPLE ANALYSIS SYSTEM
AU - Froeschl, Juergen
AU - Eichlseder, Wilfried
PY - 2010/5/6
Y1 - 2010/5/6
N2 - An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a first measurement unit adapted for measuring an oscillation, particularly a self-oscillation, of the sample and being coupled to the first clamping chuck, and a second measurement unit adapted for measuring the oscillation of the sample and being coupled to the second clamping chuck, wherein the first measurement unit is coupled to the first clamping chuck and the second measurement unit is coupled to the second clamping chuck so that measurement signals captured by the first measurement unit and by the second measurement unit are indicative of the oscillation along the sample.
AB - An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a first measurement unit adapted for measuring an oscillation, particularly a self-oscillation, of the sample and being coupled to the first clamping chuck, and a second measurement unit adapted for measuring the oscillation of the sample and being coupled to the second clamping chuck, wherein the first measurement unit is coupled to the first clamping chuck and the second measurement unit is coupled to the second clamping chuck so that measurement signals captured by the first measurement unit and by the second measurement unit are indicative of the oscillation along the sample.
M3 - Patent
M1 - WO2010049175
ER -
