Robust high-precision 2D optical range sensor
Publikationen: Konferenzbeitrag › Paper › (peer-reviewed)
Standard
Robust high-precision 2D optical range sensor. / Brandner, Markus; Thurner, Thomas.
2005. 327-335 Beitrag in Optical Measurement Systems for Industrial Inspection IV, Munich, Deutschland.
2005. 327-335 Beitrag in Optical Measurement Systems for Industrial Inspection IV, Munich, Deutschland.
Publikationen: Konferenzbeitrag › Paper › (peer-reviewed)
Harvard
Brandner, M & Thurner, T 2005, 'Robust high-precision 2D optical range sensor', Beitrag in Optical Measurement Systems for Industrial Inspection IV, Munich, Deutschland, 13/06/05 - 17/06/05 S. 327-335. https://doi.org/10.1117/12.612616
APA
Brandner, M., & Thurner, T. (2005). Robust high-precision 2D optical range sensor. 327-335. Beitrag in Optical Measurement Systems for Industrial Inspection IV, Munich, Deutschland. https://doi.org/10.1117/12.612616
Vancouver
Brandner M, Thurner T. Robust high-precision 2D optical range sensor. 2005. Beitrag in Optical Measurement Systems for Industrial Inspection IV, Munich, Deutschland. doi: 10.1117/12.612616
Author
Bibtex - Download
@conference{0ff6e4f8633a47d1be44c83e095bf81f,
title = "Robust high-precision 2D optical range sensor",
keywords = "2D range sensor, Optical sensor, Robust signal processing, Structured light",
author = "Markus Brandner and Thomas Thurner",
year = "2005",
doi = "10.1117/12.612616",
language = "English",
pages = "327--335",
note = "Optical Measurement Systems for Industrial Inspection IV ; Conference date: 13-06-2005 Through 17-06-2005",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Robust high-precision 2D optical range sensor
AU - Brandner, Markus
AU - Thurner, Thomas
PY - 2005
Y1 - 2005
KW - 2D range sensor
KW - Optical sensor
KW - Robust signal processing
KW - Structured light
UR - http://www.scopus.com/inward/record.url?scp=28844477527&partnerID=8YFLogxK
U2 - 10.1117/12.612616
DO - 10.1117/12.612616
M3 - Paper
AN - SCOPUS:28844477527
SP - 327
EP - 335
T2 - Optical Measurement Systems for Industrial Inspection IV
Y2 - 13 June 2005 through 17 June 2005
ER -
