Modelling Recrystallization of Nickel-Base Alloys
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Standard
Modelling Recrystallization of Nickel-Base Alloys. / Sommitsch, Christof; Mitter, W.; Kleber, Siegfried.
Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications. 2000. S. Internet-Internet.
Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications. 2000. S. Internet-Internet.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Sommitsch, C, Mitter, W & Kleber, S 2000, Modelling Recrystallization of Nickel-Base Alloys. in Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications. S. Internet-Internet.
APA
Sommitsch, C., Mitter, W., & Kleber, S. (2000). Modelling Recrystallization of Nickel-Base Alloys. In Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications (S. Internet-Internet)
Vancouver
Sommitsch C, Mitter W, Kleber S. Modelling Recrystallization of Nickel-Base Alloys. in Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications. 2000. S. Internet-Internet
Author
Bibtex - Download
@inproceedings{e8d0d15c0e654df98e470f1de3a2a0d2,
title = "Modelling Recrystallization of Nickel-Base Alloys",
author = "Christof Sommitsch and W. Mitter and Siegfried Kleber",
year = "2000",
language = "English",
pages = "Internet--Internet",
booktitle = "Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Modelling Recrystallization of Nickel-Base Alloys
AU - Sommitsch, Christof
AU - Mitter, W.
AU - Kleber, Siegfried
PY - 2000
Y1 - 2000
M3 - Conference contribution
SP - Internet-Internet
BT - Materials Week 2000 – Proceedings of the International Congress on Advanced Materials, their Processes and Applications
ER -
