Microstructural characterization of medium entropy alloy thin films
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in: Scripta materialia, Jahrgang 177.2020, Nr. 1 March, 01.03.2020, S. 22-26.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Microstructural characterization of medium entropy alloy thin films
AU - Chawake, N.
AU - Zálešák, Jakub
AU - Gammer, Christoph
AU - Franz, Robert
AU - Cordill, Megan J.
AU - Kim, Jeong Tae
AU - Eckert, Jürgen
N1 - Publisher Copyright: © 2019 Acta Materialia Inc.
PY - 2020/3/1
Y1 - 2020/3/1
N2 - This study presents detailed microstructural investigations on single and bilayer thin films of two medium entropy alloys (MEAs) synthesized using magnetron sputter deposition. Single layer thin films of CoCrFeNi and AlCoCrFe show single-phase face-centered cubic (fcc) and body-centered (bcc) structure, respectively. The bilayer thin film consisting of CoCrFeNi (fcc) and AlCoCrFe (bcc) has a sharp interface between them with an equiatomic composition. Nanodiffraction was used to characterize planar defects in the fcc films. This first study on bilayer film of two MEAs is transformative to other systems and will help fundamental studies on high entropy alloys.
AB - This study presents detailed microstructural investigations on single and bilayer thin films of two medium entropy alloys (MEAs) synthesized using magnetron sputter deposition. Single layer thin films of CoCrFeNi and AlCoCrFe show single-phase face-centered cubic (fcc) and body-centered (bcc) structure, respectively. The bilayer thin film consisting of CoCrFeNi (fcc) and AlCoCrFe (bcc) has a sharp interface between them with an equiatomic composition. Nanodiffraction was used to characterize planar defects in the fcc films. This first study on bilayer film of two MEAs is transformative to other systems and will help fundamental studies on high entropy alloys.
UR - http://www.scopus.com/inward/record.url?scp=85073557943&partnerID=8YFLogxK
U2 - 10.1016/j.scriptamat.2019.10.001
DO - 10.1016/j.scriptamat.2019.10.001
M3 - Article
VL - 177.2020
SP - 22
EP - 26
JO - Scripta materialia
JF - Scripta materialia
SN - 1359-6462
IS - 1 March
ER -