MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing

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MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. / Schmidt, Roland; O'Leary, Paul; Ritt, Roland et al.
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers, 2017. 7969830.

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Harvard

Schmidt, R, O'Leary, P, Ritt, R & Harker, M 2017, MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. in I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings., 7969830, Institute of Electrical and Electronics Engineers, 2017 IEEE International Instrumentation and Measurement Technology Conference, Torino, Italien, 22/05/17. https://doi.org/10.1109/I2MTC.2017.7969830

APA

Schmidt, R., O'Leary, P., Ritt, R., & Harker, M. (2017). MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings Artikel 7969830 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/I2MTC.2017.7969830

Vancouver

Schmidt R, O'Leary P, Ritt R, Harker M. MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. in I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers. 2017. 7969830 doi: 10.1109/I2MTC.2017.7969830

Author

Schmidt, Roland ; O'Leary, Paul ; Ritt, Roland et al. / MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing : Noise characteristics and suitable signal processing. I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers, 2017.

Bibtex - Download

@inproceedings{1ba6aab597114debbe190a4282a5a085,
title = "MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing",
author = "Roland Schmidt and Paul O'Leary and Roland Ritt and Matthew Harker",
year = "2017",
month = jul,
day = "5",
doi = "10.1109/I2MTC.2017.7969830",
language = "English",
booktitle = "I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",
note = "2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 ; Conference date: 22-05-2017 Through 25-05-2017",
url = "http://2017.imtc.ieee-ims.org/",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing

T2 - 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017

AU - Schmidt, Roland

AU - O'Leary, Paul

AU - Ritt, Roland

AU - Harker, Matthew

PY - 2017/7/5

Y1 - 2017/7/5

UR - http://www.scopus.com/inward/record.url?scp=85026758874&partnerID=8YFLogxK

U2 - 10.1109/I2MTC.2017.7969830

DO - 10.1109/I2MTC.2017.7969830

M3 - Conference contribution

AN - SCOPUS:85026758874

BT - I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings

PB - Institute of Electrical and Electronics Engineers

Y2 - 22 May 2017 through 25 May 2017

ER -

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