Mapping strain across Co80Ta7B13 / Co62Ta6B32 glassy interfaces
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
in: Materials and Design, Jahrgang 234.2023, Nr. October, 112327, 15.09.2023.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Mapping strain across Co80Ta7B13 / Co62Ta6B32 glassy interfaces
AU - Evertz, S.
AU - Zalesak, Jakub
AU - Hans, Marcus
AU - Jansen, H. C.
AU - Keckes, Julius
AU - Sheng, Huaping
AU - Eckert, Jürgen
AU - Gammer, C.
N1 - Publisher Copyright: © 2023 The Authors
PY - 2023/9/15
Y1 - 2023/9/15
N2 - While multilayered thin film metallic glasses offer promising mechanical properties due to their interfaces, the correlation between chemical composition and and strain at the interfaces has not been investigated so far. Hence, atomic distance and composition variations across glassy Co80Ta7B13 / Co62Ta6B32 interfaces are revealed by correlative transmission electron microscopy, nanobeam precession electron diffraction (NBPED) mapping and atom probe tomography (APT). A composition dependent mean atomic distance is identified for the individual layers. At the interfaces, a chemically graded region of 4 nm thickness is observed with APT, while the mean atomic distance gradient - investigated by NBPED mapping - extends over 9 nm and cannot solely be explained by chemical composition changes. Instead, the excess thickness of the atomic distance gradient compared to the chemical gradient can be rationalized by the presence of strain at the interface.
AB - While multilayered thin film metallic glasses offer promising mechanical properties due to their interfaces, the correlation between chemical composition and and strain at the interfaces has not been investigated so far. Hence, atomic distance and composition variations across glassy Co80Ta7B13 / Co62Ta6B32 interfaces are revealed by correlative transmission electron microscopy, nanobeam precession electron diffraction (NBPED) mapping and atom probe tomography (APT). A composition dependent mean atomic distance is identified for the individual layers. At the interfaces, a chemically graded region of 4 nm thickness is observed with APT, while the mean atomic distance gradient - investigated by NBPED mapping - extends over 9 nm and cannot solely be explained by chemical composition changes. Instead, the excess thickness of the atomic distance gradient compared to the chemical gradient can be rationalized by the presence of strain at the interface.
KW - Atom probe tomography
KW - Metallic glass
KW - Multilayer thin films
KW - Transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85172354220&partnerID=8YFLogxK
UR - https://www.sciencedirect.com/science/article/pii/S0264127523007426
U2 - 10.1016/j.matdes.2023.112327
DO - 10.1016/j.matdes.2023.112327
M3 - Article
AN - SCOPUS:85172354220
VL - 234.2023
JO - Materials and Design
JF - Materials and Design
SN - 0264-1275
IS - October
M1 - 112327
ER -