Local nanoscale strain mapping of a metallic glass during in situ testing

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Local nanoscale strain mapping of a metallic glass during in situ testing. / Gammer, Christoph; Ophus, Colin; Pekin, Thomas C. et al.
in: Applied physics letters, Jahrgang 112.2018, Nr. 17, 171905, 23.04.2018.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Harvard

APA

Gammer, C., Ophus, C., Pekin, T. C., Eckert, J., & Minor, A. M. (2018). Local nanoscale strain mapping of a metallic glass during in situ testing. Applied physics letters, 112.2018(17), Artikel 171905. https://doi.org/10.1063/1.5025686

Vancouver

Gammer C, Ophus C, Pekin TC, Eckert J, Minor AM. Local nanoscale strain mapping of a metallic glass during in situ testing. Applied physics letters. 2018 Apr 23;112.2018(17):171905. doi: 10.1063/1.5025686

Author

Gammer, Christoph ; Ophus, Colin ; Pekin, Thomas C. et al. / Local nanoscale strain mapping of a metallic glass during in situ testing. in: Applied physics letters. 2018 ; Jahrgang 112.2018, Nr. 17.

Bibtex - Download

@article{d3022ba6b28647ca8f3ec89ae05877d1,
title = "Local nanoscale strain mapping of a metallic glass during in situ testing",
author = "Christoph Gammer and Colin Ophus and Pekin, {Thomas C.} and J{\"u}rgen Eckert and Minor, {Andrew M.}",
year = "2018",
month = apr,
day = "23",
doi = "10.1063/1.5025686",
language = "English",
volume = "112.2018",
journal = "Applied physics letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "17",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Local nanoscale strain mapping of a metallic glass during in situ testing

AU - Gammer, Christoph

AU - Ophus, Colin

AU - Pekin, Thomas C.

AU - Eckert, Jürgen

AU - Minor, Andrew M.

PY - 2018/4/23

Y1 - 2018/4/23

UR - http://www.scopus.com/inward/record.url?scp=85046099410&partnerID=8YFLogxK

U2 - 10.1063/1.5025686

DO - 10.1063/1.5025686

M3 - Article

AN - SCOPUS:85046099410

VL - 112.2018

JO - Applied physics letters

JF - Applied physics letters

SN - 0003-6951

IS - 17

M1 - 171905

ER -