How tight are top seals? Insights from a comprehensive characterization workflow

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How tight are top seals? Insights from a comprehensive characterization workflow. / Shi, X.; Misch, D.; Cordill, M. et al.
84th EAGE Annual Conference and Exhibition. 2023. S. 232-236 (84th EAGE Annual Conference and Exhibition; Band 1).

Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband

Harvard

Shi, X, Misch, D, Cordill, M, Zak, S, Siedl, W, Sachsenhofer, R & Kiener, D 2023, How tight are top seals? Insights from a comprehensive characterization workflow. in 84th EAGE Annual Conference and Exhibition. 84th EAGE Annual Conference and Exhibition, Bd. 1, S. 232-236, 84th EAGE Annual Conference and Exhibition, Vienna, Österreich, 5/06/23.

APA

Shi, X., Misch, D., Cordill, M., Zak, S., Siedl, W., Sachsenhofer, R., & Kiener, D. (2023). How tight are top seals? Insights from a comprehensive characterization workflow. In 84th EAGE Annual Conference and Exhibition (S. 232-236). (84th EAGE Annual Conference and Exhibition; Band 1).

Vancouver

Shi X, Misch D, Cordill M, Zak S, Siedl W, Sachsenhofer R et al. How tight are top seals? Insights from a comprehensive characterization workflow. in 84th EAGE Annual Conference and Exhibition. 2023. S. 232-236. (84th EAGE Annual Conference and Exhibition).

Author

Shi, X. ; Misch, D. ; Cordill, M. et al. / How tight are top seals? Insights from a comprehensive characterization workflow. 84th EAGE Annual Conference and Exhibition. 2023. S. 232-236 (84th EAGE Annual Conference and Exhibition).

Bibtex - Download

@inproceedings{fb7ea1c6e9e94743b7ac566c7d5cdfed,
title = "How tight are top seals? Insights from a comprehensive characterization workflow",
author = "X. Shi and D. Misch and M. Cordill and S. Zak and W. Siedl and R. Sachsenhofer and D. Kiener",
note = "Publisher Copyright: {\textcopyright} 2023 84th EAGE Annual Conference and Exhibition. All rights reserved.; 84th EAGE Annual Conference and Exhibition ; Conference date: 05-06-2023 Through 08-06-2023",
year = "2023",
language = "English",
series = "84th EAGE Annual Conference and Exhibition",
pages = "232--236",
booktitle = "84th EAGE Annual Conference and Exhibition",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - How tight are top seals? Insights from a comprehensive characterization workflow

AU - Shi, X.

AU - Misch, D.

AU - Cordill, M.

AU - Zak, S.

AU - Siedl, W.

AU - Sachsenhofer, R.

AU - Kiener, D.

N1 - Publisher Copyright: © 2023 84th EAGE Annual Conference and Exhibition. All rights reserved.

PY - 2023

Y1 - 2023

UR - http://www.scopus.com/inward/record.url?scp=85195582037&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85195582037

T3 - 84th EAGE Annual Conference and Exhibition

SP - 232

EP - 236

BT - 84th EAGE Annual Conference and Exhibition

T2 - 84th EAGE Annual Conference and Exhibition

Y2 - 5 June 2023 through 8 June 2023

ER -

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