High-temperature video-extensometry for material testing of refractories
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Standard
High-temperature video-extensometry for material testing of refractories. / Schalk, Peter; Fauster, Ewald; O' Leary, Paul.
Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology. 2005. S. 129-139.
Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology. 2005. S. 129-139.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Schalk, P, Fauster, E & O' Leary, P 2005, High-temperature video-extensometry for material testing of refractories. in Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology. S. 129-139. <http://www.spie.org>
APA
Schalk, P., Fauster, E., & O' Leary, P. (2005). High-temperature video-extensometry for material testing of refractories. In Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology (S. 129-139) http://www.spie.org
Vancouver
Schalk P, Fauster E, O' Leary P. High-temperature video-extensometry for material testing of refractories. in Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology. 2005. S. 129-139
Author
Bibtex - Download
@inproceedings{3552a6f2828d49749acf1f6f1283dba7,
title = "High-temperature video-extensometry for material testing of refractories",
author = "Peter Schalk and Ewald Fauster and {O' Leary}, Paul",
year = "2005",
language = "English",
isbn = "0-8194-5652-7",
pages = "129--139",
booktitle = "Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - High-temperature video-extensometry for material testing of refractories
AU - Schalk, Peter
AU - Fauster, Ewald
AU - O' Leary, Paul
PY - 2005
Y1 - 2005
M3 - Conference contribution
SN - 0-8194-5652-7
SP - 129
EP - 139
BT - Machine Vision Applications in Industrial Inspection XIII, Electronic Imaging, Science and Technology
ER -
