Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Standard

Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. / Shen, Quan; Hlawacek, Gregor; Teichert, Christian et al.
2008. Postersitzung präsentiert bei EMRS Spring Meeting 2008, Strasbourg, Frankreich.

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Harvard

Shen, Q, Hlawacek, G, Teichert, C, Lex, A, Höfler, T, Trimmel, G & Kern, W 2008, 'Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films', EMRS Spring Meeting 2008, Strasbourg, Frankreich, 26/05/08 - 30/05/08.

APA

Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Höfler, T., Trimmel, G., & Kern, W. (2008). Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. Postersitzung präsentiert bei EMRS Spring Meeting 2008, Strasbourg, Frankreich.

Vancouver

Shen Q, Hlawacek G, Teichert C, Lex A, Höfler T, Trimmel G et al.. Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. 2008. Postersitzung präsentiert bei EMRS Spring Meeting 2008, Strasbourg, Frankreich.

Author

Bibtex - Download

@conference{efa35a303f9b42eaa5d0370580539c9d,
title = "Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films",
author = "Quan Shen and Gregor Hlawacek and Christian Teichert and Alexandra Lex and Thomas H{\"o}fler and Gregor Trimmel and Wolfgang Kern",
year = "2008",
language = "English",
note = "EMRS 2008 Spring meeting ; Conference date: 26-05-2008 Through 30-05-2008",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Friction Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films

AU - Shen, Quan

AU - Hlawacek, Gregor

AU - Teichert, Christian

AU - Lex, Alexandra

AU - Höfler, Thomas

AU - Trimmel, Gregor

AU - Kern, Wolfgang

PY - 2008

Y1 - 2008

M3 - Poster

T2 - EMRS 2008 Spring meeting

Y2 - 26 May 2008 through 30 May 2008

ER -