FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Standard

FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior. / Lee, Subin; Jeong, Jiwon; Kim, Youbin et al.
in: Acta materialia, Jahrgang 110.2016, Nr. 15 May, 24.03.2016, S. 283-294.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

Harvard

Lee, S, Jeong, J, Kim, Y, Han, SM, Kiener, D & Oh, SH 2016, 'FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior', Acta materialia, Jg. 110.2016, Nr. 15 May, S. 283-294. https://doi.org/10.1016/j.actamat.2016.03.017

APA

Lee, S., Jeong, J., Kim, Y., Han, S. M., Kiener, D., & Oh, S. H. (2016). FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior. Acta materialia, 110.2016(15 May), 283-294. Vorzeitige Online-Publikation. https://doi.org/10.1016/j.actamat.2016.03.017

Vancouver

Lee S, Jeong J, Kim Y, Han SM, Kiener D, Oh SH. FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior. Acta materialia. 2016 Mär 24;110.2016(15 May):283-294. Epub 2016 Mär 24. doi: 10.1016/j.actamat.2016.03.017

Author

Lee, Subin ; Jeong, Jiwon ; Kim, Youbin et al. / FIB-induced dislocations in Al submicron pillars : Annihilation by thermal annealing and effects on deformation behavior. in: Acta materialia. 2016 ; Jahrgang 110.2016, Nr. 15 May. S. 283-294.

Bibtex - Download

@article{0e1005a360844ea094462fcfe79a6bad,
title = "FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior",
keywords = "Aluminum, Annealing, Dislocations, Focused ion beam, In-situ transmission electron microscopy, Slip bursts",
author = "Subin Lee and Jiwon Jeong and Youbin Kim and Han, {Seung Min} and Daniel Kiener and Oh, {Sang Ho}",
year = "2016",
month = mar,
day = "24",
doi = "10.1016/j.actamat.2016.03.017",
language = "English",
volume = "110.2016",
pages = "283--294",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",
number = "15 May",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - FIB-induced dislocations in Al submicron pillars

T2 - Annihilation by thermal annealing and effects on deformation behavior

AU - Lee, Subin

AU - Jeong, Jiwon

AU - Kim, Youbin

AU - Han, Seung Min

AU - Kiener, Daniel

AU - Oh, Sang Ho

PY - 2016/3/24

Y1 - 2016/3/24

KW - Aluminum

KW - Annealing

KW - Dislocations

KW - Focused ion beam

KW - In-situ transmission electron microscopy

KW - Slip bursts

UR - http://www.scopus.com/inward/record.url?scp=84961618458&partnerID=8YFLogxK

U2 - 10.1016/j.actamat.2016.03.017

DO - 10.1016/j.actamat.2016.03.017

M3 - Article

AN - SCOPUS:84961618458

VL - 110.2016

SP - 283

EP - 294

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

IS - 15 May

ER -

Beziehungsdiagramm anzeigen

360 Link

Zeitschriften in BUGL