Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy. / Beinik, Igor; Kratzer, Markus; Wachauer, Astrid et al.
in: Journal of applied physics, Jahrgang 110, 2011, S. 052005-1-052005-7.
in: Journal of applied physics, Jahrgang 110, 2011, S. 052005-1-052005-7.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Beinik, I, Kratzer, M, Wachauer, A, Wang, L, Lechner, R, Teichert, C, Motz, C, Anwand, W, Brauer, G, Chen, X, Hsu, YF & Djuricis, A 2011, 'Electrical properties of ZnO nanorods studied by conductive atomic force microscopy', Journal of applied physics, Jg. 110, S. 052005-1-052005-7. https://doi.org/10.1063/1.3623764
APA
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F., & Djuricis, A. (2011). Electrical properties of ZnO nanorods studied by conductive atomic force microscopy. Journal of applied physics, 110, 052005-1-052005-7. https://doi.org/10.1063/1.3623764
Vancouver
Beinik I, Kratzer M, Wachauer A, Wang L, Lechner R, Teichert C et al. Electrical properties of ZnO nanorods studied by conductive atomic force microscopy. Journal of applied physics. 2011;110:052005-1-052005-7. doi: 10.1063/1.3623764
Author
Bibtex - Download
@article{6041ff0a9e214644ba9bdd0ae6106c4d,
title = "Electrical properties of ZnO nanorods studied by conductive atomic force microscopy",
author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Xinyi Chen and Hsu, {Y. F.} and A. Djuricis",
year = "2011",
doi = "10.1063/1.3623764",
language = "English",
volume = "110",
pages = "052005--1--052005--7",
journal = "Journal of applied physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
AU - Beinik, Igor
AU - Kratzer, Markus
AU - Wachauer, Astrid
AU - Wang, Lin
AU - Lechner, Rainer
AU - Teichert, Christian
AU - Motz, Christian
AU - Anwand, W.
AU - Brauer, Gerhard
AU - Chen, Xinyi
AU - Hsu, Y. F.
AU - Djuricis, A.
PY - 2011
Y1 - 2011
U2 - 10.1063/1.3623764
DO - 10.1063/1.3623764
M3 - Article
VL - 110
SP - 052005-1-052005-7
JO - Journal of applied physics
JF - Journal of applied physics
SN - 0021-8979
ER -
