Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp
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Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp. / Hou, Yue; Andreev, Andrey; Teichert, Christian.
2007.
2007.
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
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@book{ad0fe460851748e5951efaf41b56e575,
title = "Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp",
author = "Yue Hou and Andrey Andreev and Christian Teichert",
year = "2007",
language = "English",
}
RIS (suitable for import to EndNote) - Download
TY - BOOK
T1 - Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp
AU - Hou, Yue
AU - Andreev, Andrey
AU - Teichert, Christian
PY - 2007
Y1 - 2007
M3 - Commissioned report
BT - Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp
ER -
